March 24 - 27, 2014

The 27th International Conference on Microelectronic Test Structures will be held in Udine, Italy, bringing together scientists, technicians, designers and users of characterization techniques and test structures to discuss recent developments and future directions. The conference will take place on March 25-27, 2014, preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on March 24.

Venue

Sorry, this event is quite new so we couldn't find any venue information.
Please check again in the near future.

Related events

ICMTS Conference March 24 - 27, 2014
ICMTS Conference March 25 - 28, 2013
ICMTS Conference March 19 - 22, 2012
ICMTS Conference April 4 - 7, 2011