March 25 - 28, 2013    Osaka , Japan
The 26th International Conference on Microelectronic Test Structures (ICMTS 2013) will be held at Osaka University Nakanoshima Center, Osaka, Japan, bringing together designers and users of test structures to discuss recent developments and future directions.

Venue

Location: Osaka University Nakanoshima
Contact University Nakanoshima Center , Japan Osaka , Japan

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