European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2013
conferences > Electronics conferences > European Symposium on Reliability of Electron devices and Failure analysis (ESREF)
September 30 - October 4, 2013
Arcachon , France
ESREF 2013, the 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Arcachon (France) .
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
This event is organised by the IMS Laboratory (University Bordeaux 1, UMR CNRS 5218, IPB ) and ADERA Service with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
This event is organised by the IMS Laboratory (University Bordeaux 1, UMR CNRS 5218, IPB ) and ADERA Service with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)
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