European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2011
conferences > Electronics conferences > European Symposium on Reliability of Electron devices and Failure analysis (ESREF)
October 3 - 7, 2011
Bordeaux , France
ESREF 2011, the 22nd European Symposium on Reliability of Electron Devices will take place at Bordeaux (France) from 3rd to 7th October 2011.
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
This event is organised by the IMS Laboratory (UMR CNRS 5218, University Bordeaux 1, IPB ) and ADERA with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
This event is organised by the IMS Laboratory (UMR CNRS 5218, University Bordeaux 1, IPB ) and ADERA with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)
Venue
Location: University of Bordeaux
Contact
351 cours de la Libération 33405 TALENCE Cedex Bordeaux , France
+33 (0)5 40 00 60 00
+33 (0)5 40 00 60 00
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