March 25 - 28, 2013    Osaka , Япония
The 26th International Conference on Microelectronic Test Structures (ICMTS 2013) will be held at Osaka University Nakanoshima Center, Osaka, Japan, bringing together designers and users of test structures to discuss recent developments and future directions.

Место проведения

Location: Osaka University Nakanoshima
Обратная связь University Nakanoshima Center , Japan Osaka , Japan

Похожие мероприятия

ICMTS Conference March 25 - 28, 2013
ICMTS Conference March 19 - 22, 2012
ICMTS Conference April 4 - 7, 2011