IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2012
конференции > Electronics конференции > IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR)
October 17 - 19, 2012
Ontario , Канада
ASTR 2012 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.
Место проведения
Location: Holiday Inn Toronto Downtown Centre
Обратная связь
30 Carlton Street Toronto , M5B 2E9 Canada Ontario , Canada
1-416-9776655
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