SPIE Scanning Microscopy 2010
May 17 - 19, 2010
Monterey CA , США
• Backscattering electron diffraction
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry
Похожие мероприятия
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SPIE Scanning Microscopy 2010 May 17 - 19, 2010
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