March 25 - 28, 2013    Osaka , Giappone
The 26th International Conference on Microelectronic Test Structures (ICMTS 2013) will be held at Osaka University Nakanoshima Center, Osaka, Japan, bringing together designers and users of test structures to discuss recent developments and future directions.

Sede

Location: Osaka University Nakanoshima
Contatta University Nakanoshima Center , Japan Osaka , Japan

Eventi correlati

ICMTS Conference March 25 - 28, 2013
ICMTS Conference March 19 - 22, 2012
ICMTS Conference April 4 - 7, 2011