IEEE Eleventh Workshop on RTL and High Level Testing (WRTLT) 2010
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December 5 - 6, 2010
Shanghai , Cina
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.
The eleventh workshop on RTL and high level testing (WRTLT'10) will be hold in conjunction with the 19th Asian Test Symposium (ATS'10) in Shanghai, China. We hope and expect this workshop provides an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.
The eleventh workshop on RTL and high level testing (WRTLT'10) will be hold in conjunction with the 19th Asian Test Symposium (ATS'10) in Shanghai, China. We hope and expect this workshop provides an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.
Sede
Location: Four Points by Sheraton Shanghai Daning
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