May 22 - 27, 2011    Munich , Allemagne
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

Lieux de Rendez-Vous

Location: Munich Germany
Contact Messegelände, Entrance North Munich , Germany

Evénements Liés

SPIE Optical Metrology May 13 - 16, 2013
SPIE Optical Metrology May 22 - 27, 2011