IEEE 42nd Semiconductor Interface Specialists Conference (SISC) 2011
conferences > Semiconductor conferences > IEEE Semiconductor Interface Specialists Conference (SISC)
December 1 - 3, 2011
Arlington VA , USA
The SISC provides a unique forum for device engineers, solid-state physicists, and materials scientists to discuss issues of common interest. Principal topics for discussion at SISC are semiconductor/insulator interfaces, the physics of insulating thin films, and the interaction among materials science, device physics, and state-of-the-art technology.
The conference emphasis is on silicon-based devices, including the SiC and SiGe systems, and topics evolve with the state-of-the-art. Invited and contributed talks are complemented by informal events designed to encourage lively discussion and debate.
The conference emphasis is on silicon-based devices, including the SiC and SiGe systems, and topics evolve with the state-of-the-art. Invited and contributed talks are complemented by informal events designed to encourage lively discussion and debate.
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