May 22 - 27, 2011    Munich , Germany
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

Venue

Location: Munich Germany
Contact Messegelände, Entrance North Munich , Germany

Related events

SPIE Optical Metrology May 13 - 16, 2013
SPIE Optical Metrology May 22 - 27, 2011