International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 2010
Konferenzen > Engineering Konferenzen > International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
April 26 - 29, 2010
Hsinchu , Taiwan
The 2010 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) will be held in the Ambassador Hotel, Hsinchu, TAIWAN on April 26-29, 2010. Sponsored by Industrial Technology Research Institute (ITRI) and the Institute of Electrical and Electronics Engineers (IEEE), the VLSI-DAT provides a forum for presenting new innovations and achievements related to VLSI design, automation, and test. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after presentation in the symposium.
Ähnliche Veranstaltungen
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 22 - 24, 2015
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 28 - 30, 2014
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 22 - 24, 2013
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 23 - 25, 2012
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 25 - 28, 2011
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 26 - 29, 2010
2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 27 - 30, 2009
