March 25 - 28, 2013    Osaka , 日本
The 26th International Conference on Microelectronic Test Structures (ICMTS 2013) will be held at Osaka University Nakanoshima Center, Osaka, Japan, bringing together designers and users of test structures to discuss recent developments and future directions.

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Location: Osaka University Nakanoshima
联系 University Nakanoshima Center , Japan Osaka , Japan

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ICMTS Conference March 25 - 28, 2013
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