SPIE Scanning Microscopy 2010
May 17 - 19, 2010
Monterey CA , 美国
• Backscattering electron diffraction
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry
相关活动
SPIE Scanning Microscopy 2012 15 May, 2012
SPIE Scanning Microscopy 2011 15 May, 2011
SPIE Scanning Microscopy 2010 May 17 - 19, 2010
SPIE Scanning Microscopy 2009 May 4 - 7, 2009
