May 9 - 11, 2012    Woburn MA , 美国

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. With the continuing push to smaller technology and increased complexity in design and test of ICs and systems, the 21st NATW will feature: "Testing Challenges in Mobile Computing".

We encourage student participation by presenting a Best Student Paper Award.
 
The 2012 NATW is to be co-sponsored by the IEEE Boston Section

The 2011 NATW was sponsored by the IEEE Green Mountain Section in co-operation with TTTC  and the IEEE Boston Section.

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