IEEE International Test Conference (ITC) 2010
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November 2 - 4, 2010
TC will have three workshops taking place November 4-5 2010 at the Austin Convention Center. This year the workshops are the First IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
(3D-Test), the 2nd IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHSAC) and the IEEE International Workshop on Defect and Data-Driven Testing (D3T 2010).
Testing Three-Dimensional Stacked Integrated Circuits
(3D-Test), the 2nd IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHSAC) and the IEEE International Workshop on Defect and Data-Driven Testing (D3T 2010).
Lieux de Rendez-Vous
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Evénements Liés
IEEE International Test Conference (ITC) October 21 - 23, 2014
IEEE International Test Conference (ITC) November 2 - 4, 2010
