European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2012

The twenty-third European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2012, to be held in Cagliari, Sardinia, Italy, from 1st to 5th October 2012. This edition is a very special one, due to the joining with the 3rd edition of ISROS, the International Symposium on Reliability of Optoelectronics for Space, that will share with ESREF its scientific community and its exhibitor list, for an unprecedented event in the field of device reliability. More than 450 participants are expected to attend the joint conferences.

This international symposium will continue its 25-year history of focusing on the latest research developments and future directions in Quality and Reliability Management of materials, devices and circuits for microelectronics. It provides a European forum for developing all aspects of reliability management and the state of practice in advanced analysis techniques for present and future semiconductor applications. Hence, all aspects of specification, technology and manufacturing, test, control and analysis will be addressed. Similar to the past years, the conference will concentrate on two main areas of interest in electronics concerning designers, manufacturers and users:

• Strategy for Quality and Reliability Assessment of electronic circuits and systems
• Advanced Analysis Techniques for Technology and Product Evaluation