IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2010

ASTR 2010 will provide a forum to bridge gaps in knowledge and share ideas that address intra and inter industry endeavors to limit and eliminate field failures of products. The focus will be on rapidly finding design weaknesses, developing robust systems, and improving strategies to cost effectively screen defects and weaknesses in electronic and electro-mechanical hardware and structural systems while reconciling twin needs of obtaining high product quality and reliability with that of low product development and manufacturing costs and timely introduction of new products to market.